Abstract
Metal impurities, gold and nickel, have been deliberately introduced into boron-nitride (BN) sheets. The structural and topographic properties of doped BN have been studied by aberration corrected scanning transmission electron microscopy (STEM). Analysis revealed that metal atoms cluster preferentially in/on contaminated areas. The metal coverage on BN is almost the same for the same evaporated amount of 1 Å.
| Original language | English |
|---|---|
| Article number | 012050 |
| Journal | Journal of Physics: Conference Series |
| Volume | 371 |
| DOIs | |
| Publication status | Published - 2012 |
| Externally published | Yes |
| Event | Electron Microscopy and Analysis Group Conference 2011, EMAG 2011 - Birmingham, United Kingdom Duration: 6 Sep 2011 → 9 Sep 2011 |