New quality estimation methodology for mixed-signal and analogue ICs

T. Olbrich; I. A. Grout; Y. Eben Aimine; A. M. Richardson; J. Contensou

New quality estimation methodology for mixed-signal and analogue ICs

T. Olbrich, I. A. Grout, Y. Eben Aimine, A. M. Richardson, J. Contensou

Lancaster University

Research output: Contribution to journal › Conference article › peer-review

Abstract

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimize the manufacturing test program.

Original language	English
Pages (from-to)	573-580
Number of pages	8
Journal	Proceedings of European Design and Test Conference
Publication status	Published - 1997
Externally published	Yes
Event	Proceedings of the 1997 European Design & Test Conference - Paris, Fr Duration: 17 Mar 1997 → 20 Mar 1997

Cite this

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title = "New quality estimation methodology for mixed-signal and analogue ICs",

abstract = "IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimize the manufacturing test program.",

author = "T. Olbrich and Grout, {I. A.} and Aimine, {Y. Eben} and Richardson, {A. M.} and J. Contensou",

year = "1997",

language = "English",

pages = "573--580",

journal = "Proceedings of European Design and Test Conference",

issn = "1066-1409",

note = "Proceedings of the 1997 European Design & Test Conference ; Conference date: 17-03-1997 Through 20-03-1997",

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TY - JOUR

T1 - New quality estimation methodology for mixed-signal and analogue ICs

AU - Olbrich, T.

AU - Grout, I. A.

AU - Aimine, Y. Eben

AU - Richardson, A. M.

AU - Contensou, J.

PY - 1997

Y1 - 1997

N2 - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimize the manufacturing test program.

AB - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimize the manufacturing test program.

UR - http://www.scopus.com/inward/record.url?scp=0030697746&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0030697746

SN - 1066-1409

SP - 573

EP - 580

JO - Proceedings of European Design and Test Conference

JF - Proceedings of European Design and Test Conference

T2 - Proceedings of the 1997 European Design & Test Conference

Y2 - 17 March 1997 through 20 March 1997

ER -

New quality estimation methodology for mixed-signal and analogue ICs

Abstract

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