Noise susceptibility of ΔvBE temperature sensors in highly integrated power converters

Derek Murray, Karl Rinne

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper introduces the detrimental effects of voltage regulator noise on ΔVBE-based temperature sense circuits. The work began when a significant temperature reporting inaccuracy was observed on a commercial DC-DC power conversion module. In the paper, the observed problem will be discussed, and a Spice model presented which allows the issue to be simulated. The main part of the work, however, concentrates on a comprehensive experimental investigation of the problem. Taking into account the findings of this investigation, it was possible to significantly improve the accuracy of ΔVBE temperature sense circuits even when exposed to high levels of EMI. The paper concludes by offering important design guidelines for both analog and applications engineers when these high-precision temperature sense circuits are used on power conversion circuits.

Original languageEnglish
Title of host publicationAPEC 2014 - 29th Annual IEEE Applied Power Electronics Conference and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages552-559
Number of pages8
ISBN (Print)9781479923250
DOIs
Publication statusPublished - 2014
Externally publishedYes
Event29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014 - Fort Worth, TX, United States
Duration: 16 Mar 201420 Mar 2014

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conference

Conference29th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2014
Country/TerritoryUnited States
CityFort Worth, TX
Period16/03/1420/03/14

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