On-chip instrumentation for runtime verification in deeply embedded processors

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the field of safety-critical applications, the industry has seen a dramatic increase in system integration and complexity for on-chip solutions, and this provides new challenges in gaining deep testability access within such products. IC developers have responded to this challenge by creating sophisticated on-chip trace/test/debug modules to facilitate real-time access to application programs' features in deeply embedded pipeline and cache based architectures for embedded-core-based chips. However, the emerging safety requirements for complex systems demand more stringent solutions for confirming confidence in systems and this leads to a requirement for the formal verification of some key system properties. In this paper the authors propose that the existing architectures for on-chip trace/test/debug modules can be extended to support runtime verification monitoring, working towards the formal verification of system properties of interest. A real benefit in the proposed solution is the provision of a lifecycle use for the on-chip debug logic, thus offering an improved return-on-investment prospect by justifying the resident logic with the benefit gained by lifelong runtime verification features.

Original languageEnglish
Title of host publicationProceedings - IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015
PublisherIEEE Computer Society
Pages374-379
Number of pages6
ISBN (Electronic)9781479987184
DOIs
Publication statusPublished - 27 Oct 2015
EventIEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015 - Montpellier, France
Duration: 8 Jul 201510 Jul 2015

Publication series

NameProceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
Volume07-10-July-2015
ISSN (Print)2159-3469
ISSN (Electronic)2159-3477

Conference

ConferenceIEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015
Country/TerritoryFrance
CityMontpellier
Period8/07/1510/07/15

Keywords

  • Embedded processor
  • Monitors
  • On-chip debug
  • Runtime verification
  • Safety critical

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