Original language | English |
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Pages (from-to) | 1526-1527 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 18 |
Issue number | S2 |
DOIs | |
Publication status | Published - Jul 2012 |
Externally published | Yes |
Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
Q. M. Ramasse, N. Alem, O. V. Yazyev, A. Zettl, C. T. Pan, R. R. Nair, R. Jalil, R. Zan, U. Bangert, C. R. Seabourne, A. J. Scott, K. S. Novoselov
Research output: Contribution to journal › Article › peer-review