Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Q. M. Ramasse, N. Alem, O. V. Yazyev, A. Zettl, C. T. Pan, R. R. Nair, R. Jalil, R. Zan, U. Bangert, C. R. Seabourne, A. J. Scott, K. S. Novoselov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1526-1527
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
Publication statusPublished - Jul 2012
Externally publishedYes

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