Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Q. M. Ramasse; N. Alem; O. V. Yazyev; A. Zettl; C. T. Pan; R. R. Nair; R. Jalil; R. Zan; U. Bangert; C. R. Seabourne; A. J. Scott; K. S. Novoselov

doi:10.1017/S1431927612009488

Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Q. M. Ramasse
, N. Alem
, O. V. Yazyev
, A. Zettl
, C. T. Pan
, R. R. Nair
, R. Jalil
, R. Zan
, U. Bangert
, C. R. Seabourne
, A. J. Scott
, K. S. Novoselov

Engineering and Physical Sciences Research Council
University of California
Swiss Federal Institute of Technology Lausanne
University of Manchester
University of Leeds

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1526-1527
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612009488
Publication status	Published - Jul 2012
Externally published	Yes

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Ramasse, Q. M., Alem, N., Yazyev, O. V., Zettl, A., Pan, C. T., Nair, R. R., Jalil, R., Zan, R., Bangert, U., Seabourne, C. R., Scott, A. J., & Novoselov, K. S. (2012). Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS. Microscopy and Microanalysis, 18(S2), 1526-1527. https://doi.org/10.1017/S1431927612009488

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title = "Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS",

author = "Ramasse, \{Q. M.\} and N. Alem and Yazyev, \{O. V.\} and A. Zettl and Pan, \{C. T.\} and Nair, \{R. R.\} and R. Jalil and R. Zan and U. Bangert and Seabourne, \{C. R.\} and Scott, \{A. J.\} and Novoselov, \{K. S.\}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009488",

language = "English",

volume = "18",

pages = "1526--1527",

journal = "Microscopy and Microanalysis",

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}

Ramasse, QM, Alem, N, Yazyev, OV, Zettl, A, Pan, CT, Nair, RR, Jalil, R, Zan, R, Bangert, U, Seabourne, CR, Scott, AJ & Novoselov, KS 2012, 'Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS', Microscopy and Microanalysis, vol. 18, no. S2, pp. 1526-1527. https://doi.org/10.1017/S1431927612009488

TY - JOUR

T1 - Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

AU - Ramasse, Q. M.

AU - Alem, N.

AU - Yazyev, O. V.

AU - Zettl, A.

AU - Pan, C. T.

AU - Nair, R. R.

AU - Jalil, R.

AU - Zan, R.

AU - Bangert, U.

AU - Seabourne, C. R.

AU - Scott, A. J.

AU - Novoselov, K. S.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85009585694

U2 - 10.1017/S1431927612009488

DO - 10.1017/S1431927612009488

M3 - Article

AN - SCOPUS:85009585694

SN - 1431-9276

VL - 18

SP - 1526

EP - 1527

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

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