Abstract
Visualizing and understanding the underlying processes in short production run environments is not possible with standard Shewhart control charts. Administration of multiple charts, frequent setups and changeovers, and the truncated nature of data collection limit the effectiveness of standard statistical process control (SPC) approaches. This article introduces a process visualization approach by adapting short-run SPC and recommends new rules for interpretation.
Original language | English |
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Pages (from-to) | 247-265 |
Number of pages | 19 |
Journal | Quality Engineering |
Volume | 25 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Jul 2013 |
Keywords
- average run length (ARL)
- process monitoring
- runs rules
- short-run statistical process control
- statistical process control