Process visualization in medical device manufacture: An adaptation of short run SPC techniques

Sean S. Moore, Eamonn Murphy

Research output: Contribution to journalArticlepeer-review

Abstract

Visualizing and understanding the underlying processes in short production run environments is not possible with standard Shewhart control charts. Administration of multiple charts, frequent setups and changeovers, and the truncated nature of data collection limit the effectiveness of standard statistical process control (SPC) approaches. This article introduces a process visualization approach by adapting short-run SPC and recommends new rules for interpretation.

Original languageEnglish
Pages (from-to)247-265
Number of pages19
JournalQuality Engineering
Volume25
Issue number3
DOIs
Publication statusPublished - 1 Jul 2013

Keywords

  • average run length (ARL)
  • process monitoring
  • runs rules
  • short-run statistical process control
  • statistical process control

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