Random depth access full-field low-coherence interferometry applied to a small punch test

Patrick Egan, Maurice P. Whelan, Fereydoun Lakestani, Michael J. Connelly

Research output: Contribution to journalArticlepeer-review

Abstract

In small punch testing, with approximate preknowledge of the sample deformation, profile measurement need only be made at selected locations in depth. To date, profilometry through full-field low-coherence interferometry has not been applied to small punch testing-conventional methods typically measure the maximum displacement as the sample is deformed, ignoring useful shape and profile information. A modification of full-field low-coherence interferometry is presented, where a digital stepper motor is combined with piezoelectric transducer scanning to achieve random depth access three-dimensional micrometer profile measurement. Offering a rapid, inexpensive, and functional machine vision system, the measurement technique is applied to a small punch test.

Original languageEnglish
Pages (from-to)523-529
Number of pages7
JournalOptics and Lasers in Engineering
Volume45
Issue number4
DOIs
Publication statusPublished - Apr 2007

Keywords

  • Figure
  • Height measurements
  • Interferometry
  • Small punch test
  • Surface measurements
  • Three-dimensional sensing

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