Scanning tunnelling microscopy of suspended graphene

Recep Zan; Chris Muryn; Ursel Bangert; Philip Mattocks; Paul Wincott; David Vaughan; Xuesong Li; Luigi Colombo; Rodney S. Ruoff; Bruce Hamilton; Konstantin S. Novoselov

doi:10.1039/c2nr30162h

Scanning tunnelling microscopy of suspended graphene

Recep Zan, Chris Muryn, Ursel Bangert, Philip Mattocks, Paul Wincott, David Vaughan, Xuesong Li, Luigi Colombo, Rodney S. Ruoff, Bruce Hamilton, Konstantin S. Novoselov

Research output: Contribution to journal › Article › peer-review

Abstract

Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

Original language	English
Pages (from-to)	3065-3068
Number of pages	4
Journal	Nanoscale
Volume	4
Issue number	10
DOIs	https://doi.org/10.1039/c2nr30162h
Publication status	Published - 21 May 2012
Externally published	Yes

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title = "Scanning tunnelling microscopy of suspended graphene",

abstract = "Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.",

author = "Recep Zan and Chris Muryn and Ursel Bangert and Philip Mattocks and Paul Wincott and David Vaughan and Xuesong Li and Luigi Colombo and Ruoff, {Rodney S.} and Bruce Hamilton and Novoselov, {Konstantin S.}",

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AU - Zan, Recep

AU - Muryn, Chris

AU - Bangert, Ursel

AU - Mattocks, Philip

AU - Wincott, Paul

AU - Vaughan, David

AU - Li, Xuesong

AU - Colombo, Luigi

AU - Ruoff, Rodney S.

AU - Hamilton, Bruce

AU - Novoselov, Konstantin S.

PY - 2012/5/21

Y1 - 2012/5/21

N2 - Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

AB - Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

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U2 - 10.1039/c2nr30162h

DO - 10.1039/c2nr30162h

M3 - Article

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SN - 2040-3364

VL - 4

SP - 3065

EP - 3068

JO - Nanoscale

JF - Nanoscale

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Scanning tunnelling microscopy of suspended graphene

Abstract

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