Scanning tunnelling microscopy of suspended graphene

R. Zan, U. Bangert, C. Muryn, P. Mattocks, B. Hamilton, K. S. Novoselov

Research output: Contribution to journalConference articlepeer-review

Abstract

We have obtained for the first time atomic resolution STM images of free-standing graphene, and have found UHV high temperature annealing conditions to controllably achieve atomically clean surfaces. This is an important premise for fundamental studies of the interaction of pristine graphene with foreign atom species, in particular metals.

Original languageEnglish
Article number012070
JournalJournal of Physics: Conference Series
Volume371
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventElectron Microscopy and Analysis Group Conference 2011, EMAG 2011 - Birmingham, United Kingdom
Duration: 6 Sep 20119 Sep 2011

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