Scanning tunnelling microscopy of suspended graphene

  • Recep Zan
  • , Chris Muryn
  • , Ursel Bangert
  • , Philip Mattocks
  • , Paul Wincott
  • , David Vaughan
  • , Xuesong Li
  • , Luigi Colombo
  • , Rodney S. Ruoff
  • , Bruce Hamilton
  • , Konstantin S. Novoselov

Research output: Contribution to journalArticlepeer-review

Abstract

Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

Original languageEnglish
Pages (from-to)3065-3068
Number of pages4
JournalNanoscale
Volume4
Issue number10
DOIs
Publication statusPublished - 21 May 2012
Externally publishedYes

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