@inproceedings{ce95e2fb0dc54a5eb8d3afb24f81d0ce,
title = "TEM studies of buried heterostructure laser diodes before and after overstress testing",
abstract = "Transmission electron microscopy studies have been carried out on degraded buried heterostructure lasers and unaged controls. Degradation was produced by deliberately overstressing the lasers at high currents and high temperatures.",
author = "U. Bangert and Briggs, {A. T.R.} and Goodwin, {A. R.} and P. Charsley",
year = "1991",
language = "English",
isbn = "0854984062",
series = "Institute of Physics Conference Series",
publisher = "Publ by Inst of Physics Publ Ltd",
number = "117",
pages = "581--584",
booktitle = "Institute of Physics Conference Series",
edition = "117",
note = "Proceedings of the Conference on Microscopy of Semiconducting Materials 1991 ; Conference date: 25-03-1991 Through 28-03-1991",
}