TEM studies of buried heterostructure laser diodes before and after overstress testing

  • U. Bangert
  • , A. T.R. Briggs
  • , A. R. Goodwin
  • , P. Charsley

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Fingerprint

Dive into the research topics of 'TEM studies of buried heterostructure laser diodes before and after overstress testing'. Together they form a unique fingerprint.

Physics

Earth and Planetary Sciences

Engineering