Test-based model generation for legacy systems

Hardi Hungar, Tiziana Margaria, Bernhard Steffen

Research output: Contribution to journalConference articlepeer-review

Abstract

We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes. We gather observations via an automated test environment and systematically extend available test suites according to learning procedures. Testing plays two roles here: (i) as an application domain and (ii) as the enabling technology for the adopted learning technique. The benefits include enhanced error detection and diagnosis, both during the testing phase and the online test of deployed systems at customer sites.

Original languageEnglish
Pages (from-to)971-980
Number of pages10
JournalIEEE International Test Conference (TC)
Publication statusPublished - 2003
Externally publishedYes
EventProceedings International Test Conference 2003 - Charlotte, NC, United States
Duration: 30 Sep 20032 Oct 2003

Fingerprint

Dive into the research topics of 'Test-based model generation for legacy systems'. Together they form a unique fingerprint.

Cite this