TY - JOUR
T1 - The Design and Validation of a Rain Model for a Simulated Automotive Environment
AU - Brophy, Tim
AU - Deegan, Brian
AU - Salado, Javier
AU - Tena, Ángel
AU - Denny, Patrick
AU - Glavin, Martin
AU - Ward, Enda
AU - Horgan, Jonathan
AU - Jones, Edward
N1 - Publisher Copyright:
© 2023, Society for Imaging Science and Technology.
PY - 2023
Y1 - 2023
N2 - This paper presents the design of an accurate rain model for the commercially-available Anyverse automotive simulation environment. The model incorporates the physical properties of rain and a process to validate the model against real rain is proposed. Due to the high computational complexity of path tracing through a particle-based model, a second more computationally efficient model is also proposed. For the second model, the rain is modeled using a combination of a particle-based model and an attenuation field. The attenuation field is fine-tuned against the particle-only model to minimize the difference between the models.
AB - This paper presents the design of an accurate rain model for the commercially-available Anyverse automotive simulation environment. The model incorporates the physical properties of rain and a process to validate the model against real rain is proposed. Due to the high computational complexity of path tracing through a particle-based model, a second more computationally efficient model is also proposed. For the second model, the rain is modeled using a combination of a particle-based model and an attenuation field. The attenuation field is fine-tuned against the particle-only model to minimize the difference between the models.
UR - http://www.scopus.com/inward/record.url?scp=85169544793&partnerID=8YFLogxK
U2 - 10.2352/EI.2023.35.16.AVM-116
DO - 10.2352/EI.2023.35.16.AVM-116
M3 - Conference article
AN - SCOPUS:85169544793
SN - 2470-1173
VL - 35
JO - IS and T International Symposium on Electronic Imaging Science and Technology
JF - IS and T International Symposium on Electronic Imaging Science and Technology
IS - 16
M1 - 116
T2 - IS and T International Symposium on Electronic Imaging: Autonomous Vehicles and Machines, AVM 2023
Y2 - 15 January 2023 through 19 January 2023
ER -