The dynamics of a small-scale portable electronics device under impact stimuli

Gerard A. Kelly; Jeff M. Punch; Suresh Goyal

doi:10.1115/IMECE2006-14371

The dynamics of a small-scale portable electronics device under impact stimuli

Gerard A. Kelly, Jeff M. Punch, Suresh Goyal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The reliability of portable electronic devices is of critical importance due to the consumer boom in mobile telephony in recent years. Impact is a key driver of failure in portable electronics and, in current design practice, extensive testing is used in conjunction with finite element simulations to ensure product reliability under impact stimuli. Testing is time-consuming and expensive - both free-drop and constrained drop tests are usually applied - and simulation techniques are very computationally intensive. The response of portable electronic devices to impact is currently not well understood, and there is clear need for investigation into the range of acceleration levels experienced by a representative model of a portable electronic device on impact. In this paper, free-drop testing was carried out on test vehicles representative of a typical mobile phone in order to acquire acceleration data from impact events. Drop test vehicles from Nylon and aluminium were used to provide a means of comparison for diverse material properties. The primary conclusion was that the dynamics of each drop event were highly sensitive to the initial conditions of the drop test, which was evident from wide variances in the acceleration data.

Original language	English
Title of host publication	Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging
Publisher	American Society of Mechanical Engineers (ASME)
ISBN (Print)	0791837904, 9780791837900
DOIs	https://doi.org/10.1115/IMECE2006-14371
Publication status	Published - 2006
Event	2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Chicago, IL, United States Duration: 5 Nov 2006 → 10 Nov 2006

Publication series

Name	American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP
ISSN (Print)	1071-6947

Conference

Conference	2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006
Country/Territory	United States
City	Chicago, IL
Period	5/11/06 → 10/11/06

Keywords

Acceleration measurement
Drop tests
Impact dynamics

Access to Document

10.1115/IMECE2006-14371

Cite this

Kelly, G. A., Punch, J. M., & Goyal, S. (2006). The dynamics of a small-scale portable electronics device under impact stimuli. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP). American Society of Mechanical Engineers (ASME). https://doi.org/10.1115/IMECE2006-14371

Kelly, Gerard A. ; Punch, Jeff M. ; Goyal, Suresh. / The dynamics of a small-scale portable electronics device under impact stimuli. Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME), 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP).

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abstract = "The reliability of portable electronic devices is of critical importance due to the consumer boom in mobile telephony in recent years. Impact is a key driver of failure in portable electronics and, in current design practice, extensive testing is used in conjunction with finite element simulations to ensure product reliability under impact stimuli. Testing is time-consuming and expensive - both free-drop and constrained drop tests are usually applied - and simulation techniques are very computationally intensive. The response of portable electronic devices to impact is currently not well understood, and there is clear need for investigation into the range of acceleration levels experienced by a representative model of a portable electronic device on impact. In this paper, free-drop testing was carried out on test vehicles representative of a typical mobile phone in order to acquire acceleration data from impact events. Drop test vehicles from Nylon and aluminium were used to provide a means of comparison for diverse material properties. The primary conclusion was that the dynamics of each drop event were highly sensitive to the initial conditions of the drop test, which was evident from wide variances in the acceleration data.",

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Kelly, GA, Punch, JM & Goyal, S 2006, The dynamics of a small-scale portable electronics device under impact stimuli. in Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP, American Society of Mechanical Engineers (ASME), 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006, Chicago, IL, United States, 5/11/06. https://doi.org/10.1115/IMECE2006-14371

The dynamics of a small-scale portable electronics device under impact stimuli. / Kelly, Gerard A.; Punch, Jeff M.; Goyal, Suresh.
Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME), 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - The reliability of portable electronic devices is of critical importance due to the consumer boom in mobile telephony in recent years. Impact is a key driver of failure in portable electronics and, in current design practice, extensive testing is used in conjunction with finite element simulations to ensure product reliability under impact stimuli. Testing is time-consuming and expensive - both free-drop and constrained drop tests are usually applied - and simulation techniques are very computationally intensive. The response of portable electronic devices to impact is currently not well understood, and there is clear need for investigation into the range of acceleration levels experienced by a representative model of a portable electronic device on impact. In this paper, free-drop testing was carried out on test vehicles representative of a typical mobile phone in order to acquire acceleration data from impact events. Drop test vehicles from Nylon and aluminium were used to provide a means of comparison for diverse material properties. The primary conclusion was that the dynamics of each drop event were highly sensitive to the initial conditions of the drop test, which was evident from wide variances in the acceleration data.

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Kelly GA, Punch JM, Goyal S. The dynamics of a small-scale portable electronics device under impact stimuli. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Electronic and Photonics Packaging. American Society of Mechanical Engineers (ASME). 2006. (American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP). doi: 10.1115/IMECE2006-14371

The dynamics of a small-scale portable electronics device under impact stimuli

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