Thermal challenges in photonic integrated circuits

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Photonics Integrated Circuits (PICs), a feature of contemporary optical communications technologies, can represent a stringent packaging challenge, particularly in terms of their requirements for thermal control. Devices such as laser arrays can demonstrate tight temperature limits, sub-ambient operating temperatures, moderate heat loads but high device-level heat fluxes. A key feature of many hybrid PICs is a multi-layer substrate which offers mechanical support, electrical interconnection and heat spreading for the devices that it carries; such substrates are typically mounted on a thermoelectric module (TEM) to achieve thermal control. This paper considers two thermal challenges associated with such PICs, in order to ensure their efficient operation: the requirement for aggressive heat sinking; and the imperative of adequate heat spreading within the substrate on the temperature controlled side of the TEM. To this end, a closed-form electrothermal model is developed for a representative PIC which captures the conductive heat transfer within the substrate, coupled with a constitutive representation of the TEM and its heat sink. An example of a laser array PIC is considered in order to illustrate the importance of heat sinking and spreading. This paper represents some initial results of an extensive programme of work on packaging-related aspects of next-generation PICs.

Original languageEnglish
Title of host publication2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012
DOIs
Publication statusPublished - 2012
Event2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012 - Cascais, Portugal
Duration: 16 Apr 201218 Apr 2012

Publication series

Name2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012

Conference

Conference2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012
Country/TerritoryPortugal
CityCascais
Period16/04/1218/04/12

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