TY - JOUR
T1 - Thermal fatigue and failure analysis of SnAgCu solder alloys with minor Pb additions
AU - Collins, Maurice N.
AU - Punch, Jeff
AU - Coyle, Richard
AU - Reid, Michael
AU - Popowich, Richard
AU - Read, Peter
AU - Fleming, Debra
PY - 2011/10
Y1 - 2011/10
N2 - The thermal fatigue performances of Sn 98.5Ag 1.0Cu 0.5 (SAC105), Sn 97.5Ag 2.0Cu 0.5 (SAC205), Sn 96.5Ag 3.0Cu 0.5 (SAC305) and Sn 95.5Ag 4.0Cu 0.5 (SAC405) solder alloys with Pb terminations were investigated by accelerated temperature cycling with and without thermal preconditioning. The performance of the SAC alloys was compared to eutectic SnPb and aged SAC alloys. The test vehicle consists of commercial 2512 ceramic chip resistors soldered to printed wiring boards using the different solder alloy compositions. The solder joints were monitored continuously during a thermal cycle of 0°C -100°C with a ramp rate of 9°C/min and a 30 min dwell between temperature extremes. Failures were defined in accordance with the IPC-9701 A industry test guidelines and failure data are reported as characteristic life η (number of cycles to 63.2% failure) from a two-parameter Weibull distribution. The microstructural evolution was characterized using metallographic techniques and back-scattered scanning electron microscopy. The findings show that the lifetime of the alloys can be ranked as follows: SAC 305 ∼ SAC 405 SAC 205 SAC 105 SAC305 aged SAC105 aged SnPb and to determine mechanisms of failure, electron microscopy analysis and fractography were performed on post-cycled components.
AB - The thermal fatigue performances of Sn 98.5Ag 1.0Cu 0.5 (SAC105), Sn 97.5Ag 2.0Cu 0.5 (SAC205), Sn 96.5Ag 3.0Cu 0.5 (SAC305) and Sn 95.5Ag 4.0Cu 0.5 (SAC405) solder alloys with Pb terminations were investigated by accelerated temperature cycling with and without thermal preconditioning. The performance of the SAC alloys was compared to eutectic SnPb and aged SAC alloys. The test vehicle consists of commercial 2512 ceramic chip resistors soldered to printed wiring boards using the different solder alloy compositions. The solder joints were monitored continuously during a thermal cycle of 0°C -100°C with a ramp rate of 9°C/min and a 30 min dwell between temperature extremes. Failures were defined in accordance with the IPC-9701 A industry test guidelines and failure data are reported as characteristic life η (number of cycles to 63.2% failure) from a two-parameter Weibull distribution. The microstructural evolution was characterized using metallographic techniques and back-scattered scanning electron microscopy. The findings show that the lifetime of the alloys can be ranked as follows: SAC 305 ∼ SAC 405 SAC 205 SAC 105 SAC305 aged SAC105 aged SnPb and to determine mechanisms of failure, electron microscopy analysis and fractography were performed on post-cycled components.
KW - Materials reliability
KW - materials science and technology
KW - soldering
UR - http://www.scopus.com/inward/record.url?scp=84859044657&partnerID=8YFLogxK
U2 - 10.1109/TCPMT.2011.2150223
DO - 10.1109/TCPMT.2011.2150223
M3 - Article
AN - SCOPUS:84859044657
SN - 2156-3950
VL - 1
SP - 1594
EP - 1600
JO - IEEE Transactions on Components, Packaging and Manufacturing Technology
JF - IEEE Transactions on Components, Packaging and Manufacturing Technology
IS - 10
M1 - 6041061
ER -