TY - GEN
T1 - Thermo-fluidic coupled analysis of flip-chip mounted thermal test chips on a PCB-A numerical and experimental study
AU - Schacht, R.
AU - Punch, J.
AU - Merten, E.
AU - Rzepka, S.
AU - Michel, B.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015
Y1 - 2015
N2 - The concentration of electronic and mechanical components on a PCB (e.g. a PC main board) continues to increase, leading to higher power densities and more stringent requirements for thermal management. In current and future air-cooled applications, in addition to conductive interaction, the consequences of natural and forced thermo-fluidic coupling must also be considered during the PCB layout process. The circuit design engineer therefore needs additional information on the natural and forced fluidic influence between critical heat dissipating components, and the fluidic interference due to other, adjacent electronic and mechanical component packages. In the past, several benchmark studies have been published on convective and conductive thermal interaction for different commercially-Available microelectronic packages. Nowadays, the Flip-Chip (FC) assembly technology of bare dies has become firmly established, and there is a need for a thermal benchmark study on FC assemblies. This investigation examines the natural and forced thermo-fluidic interaction between bare FC dies and other components, assembled on several test boards. A validation of the first results has shown a suitable agreement between simulation and experiment.
AB - The concentration of electronic and mechanical components on a PCB (e.g. a PC main board) continues to increase, leading to higher power densities and more stringent requirements for thermal management. In current and future air-cooled applications, in addition to conductive interaction, the consequences of natural and forced thermo-fluidic coupling must also be considered during the PCB layout process. The circuit design engineer therefore needs additional information on the natural and forced fluidic influence between critical heat dissipating components, and the fluidic interference due to other, adjacent electronic and mechanical component packages. In the past, several benchmark studies have been published on convective and conductive thermal interaction for different commercially-Available microelectronic packages. Nowadays, the Flip-Chip (FC) assembly technology of bare dies has become firmly established, and there is a need for a thermal benchmark study on FC assemblies. This investigation examines the natural and forced thermo-fluidic interaction between bare FC dies and other components, assembled on several test boards. A validation of the first results has shown a suitable agreement between simulation and experiment.
UR - http://www.scopus.com/inward/record.url?scp=84966415444&partnerID=8YFLogxK
U2 - 10.1109/THERMINIC.2015.7389603
DO - 10.1109/THERMINIC.2015.7389603
M3 - Conference contribution
AN - SCOPUS:84966415444
T3 - THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems
BT - THERMINIC 2015 - 21st International Workshop on Thermal Investigations of ICs and Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 21st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2015
Y2 - 30 September 2015 through 2 October 2015
ER -