Towards electrochemical fabrication of free-standing indium phosphide nanofilms

Nathan Quill, Colm O'Dwyer, D. Noel Buckley, Robert P. Lynch

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The formation of sub-surface truncated tetrahedral voids beneath suspended ∼40 nm thick dense InP shelves is achievable via a twostep etching method. The first step involves the electrochemical anodisation of n-type InP in aqueous KOH electrolyte resulting in the formation of truncated tetrahedral domains of pores beneath an ~40 nm thick dense surface layer with an individual pit that penetrates the dense surface layer of each domain. The second step involves the preferential chemical etching of these porous domains with only limited etching of the surrounding bulk InP and dense surface layer. The resulting structure of each domain is a truncated tetrahedral void with a dense InP layer suspended above it. This new technique may be a very useful tool in the fabrication of devices based on III-V semiconductors and it may be possible to extend the technique to the fabrication of free-standing InP nanofilms.

Original languageEnglish
Title of host publicationState-of-the-Art Program on Compound Semiconductors 58, SOTAPOCS 58
EditorsJ. H. He, C. O'Dwyer, F. Ren, E. Douglas, C. Jagadish, S. Jang, Y. L. Wang, R. P. Lynch, T. J. Anderson, J. K. Hite
PublisherElectrochemical Society Inc.
Pages33-48
Number of pages16
Edition14
ISBN (Electronic)9781607685395
DOIs
Publication statusPublished - 2015
EventSymposium on State-of-the-Art Program on Compound Semiconductors 58, SOTAPOCS 2015 - 228th ECS Meeting - Phoenix, United States
Duration: 11 Oct 201515 Oct 2015

Publication series

NameECS Transactions
Number14
Volume69
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

ConferenceSymposium on State-of-the-Art Program on Compound Semiconductors 58, SOTAPOCS 2015 - 228th ECS Meeting
Country/TerritoryUnited States
CityPhoenix
Period11/10/1515/10/15

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