TY - JOUR
T1 - Transition Metal-Substituted Krebs-Type Polyoxometalate-Doped PEDOT Films
AU - Naseer, R.
AU - Ali, B.
AU - Laffir, F.
AU - Kailas, L.
AU - Dickinson, C.
AU - Armstrong, G.
AU - McCormac, T.
N1 - Publisher Copyright:
© 2019 American Chemical Society.
PY - 2019/8/27
Y1 - 2019/8/27
N2 - The transition metal-substituted Krebs-type polyoxometalates (POMs) [Sb2W20M2O70(H2O)6]n-, M = Fe(III), Co(II), or Cu(II), were surface immobilized within the conducting polymer 3,4-ethylenedioxythiophene (PEDOT) on glassy carbon electrode surfaces. The immobilized films of different thicknesses were characterized by electrochemical and surface-based techniques. The inherent redox activity for the Krebs-type POMs, [Sb2W20M2O70(H2O)6]n-, M = Fe(III), Co(II), or Cu(II), that were observed in the solution phase were maintained in the polymeric PEDOT matrix. The resulting films were found to be extremely stable toward redox switching between the various POM-based redox states. The films exhibited pH-dependent redox activity and thin layer behavior up to 100 mV s-1. The films were found to be highly conductive through the employment of electrochemical impedance spectroscopy. Surface characterization of the films was carried out by X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy graph.
AB - The transition metal-substituted Krebs-type polyoxometalates (POMs) [Sb2W20M2O70(H2O)6]n-, M = Fe(III), Co(II), or Cu(II), were surface immobilized within the conducting polymer 3,4-ethylenedioxythiophene (PEDOT) on glassy carbon electrode surfaces. The immobilized films of different thicknesses were characterized by electrochemical and surface-based techniques. The inherent redox activity for the Krebs-type POMs, [Sb2W20M2O70(H2O)6]n-, M = Fe(III), Co(II), or Cu(II), that were observed in the solution phase were maintained in the polymeric PEDOT matrix. The resulting films were found to be extremely stable toward redox switching between the various POM-based redox states. The films exhibited pH-dependent redox activity and thin layer behavior up to 100 mV s-1. The films were found to be highly conductive through the employment of electrochemical impedance spectroscopy. Surface characterization of the films was carried out by X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy graph.
UR - http://www.scopus.com/inward/record.url?scp=85071681655&partnerID=8YFLogxK
U2 - 10.1021/acs.langmuir.8b03785
DO - 10.1021/acs.langmuir.8b03785
M3 - Article
C2 - 30892897
AN - SCOPUS:85071681655
SN - 0743-7463
VL - 35
SP - 11007
EP - 11015
JO - Langmuir
JF - Langmuir
IS - 34
ER -