Void fraction measurement using electrical capacitance tomography and high speed photography

Madhavi V. Sardeshpande, Sagar Harinarayan, Vivek V. Ranade

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Void fraction measurement using electrical capacitance tomography and high speed photography'. Together they form a unique fingerprint.

Engineering

Chemical Engineering